Depletion width measurement in an organic Schottky contact using a metal-semiconductor field-effect transistor

Applied Physics Letters

Volumn 91, Issue 8, 2007, Pages

  Takshi, Arash ^a   Dimopoulos, Alexandros ^b   Madden, John D ^b  

^a UNIVERSITY OF BRITISH COLUMBIA   (Canada)

^b NONE

Author keywords

[No Author keywords available]

Indexed keywords

DRAIN CURRENT; ELECTRIC POTENTIAL; ELECTRON TRAPS; SCHOTTKY BARRIER DIODES;

DEPLETION WIDTH MEASUREMENT; DRAIN-SOURCE VOLTAGE;

MOSFET DEVICES;

EID: 34548262807     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2773953     Document Type: Article

References (18)

1. W. Brutting, S. Berleb, and A. G. Muckl, Org. Electron. 2, 1 (2001).
2. C. J. Brabec, N. S. Sariciftci, and J. C. Hummelen, Adv. Funct. Mater. 11, 15 (2001).
3. M. Bohm, A. Ullmann, D. Zipperer, A. Knobloch, W. H. Glauert, and W. Fix, in Solid-State Circuits, 2006 IEEE International Conference Digest of Technical Papers (IEEE, New York, 2006), pp. 1034-1041.
4. S. M. Sze and K. N. Kwok, Physics of Semiconductor Devices, 3rd ed. (Wiley, Hoboken, NJ, 2006), Chap., pp. 134-196.
5. G. Horowitz, Adv. Mater. (Weinheim, Ger.) 10, 365 (1998).
6. B. G. Streetman and S. Banerjee, Solid State Electronic Devices, 5th ed. (Prentice-Hall, Upper Saddle River, NJ, 2000), Chap., pp. 241-321.
7. E. H. Rhoderick and R. H. Williams, Metal-Semiconductor Contacts, 2nd ed. (Clarendon, Oxford, 1988), Appendix E, pp. 226-231.
8. E. J. Meijer, A. V. G. Mangnus, C. M. Hart, D. M. de Leeuw, and T. M. Klapwijk, Appl. Phys. Lett. 78, 3902 (2001).
9. R. Gupta, S. C. K. Misra, B. D. Malhotra, N. N. Beladakere, and S. Chandra, Appl. Phys. Lett. 58, 51 (1991).
10. P. Stallinga, H. L. Gomes, M. Murgia, and K. Mullen, Org. Electron. 3, 43 (2002).
11. J. M. S. Shaw and P. F. Seidler, IBM J. Res. Dev. 45, 3 (2001).
12. www.adsdyes.com
13. S. P. Speakman, G. G. Rozenberg, K. J. Clay, W. I. Milne, A. Ille, I. A. Gardner, E. Bresler, and J. H. G. Steinke, Org. Electron. 2, 65 (2001).
14. P. E. Burrows and V. Bulovic, Appl. Phys. Lett. 65, 2922 (1994).
15. V. C. Nguyen and K. Potje-Kamloth, Thin Solid Films 338, 142 (1999).
16. A. J. Campbell, D. D. C. Bradley, E. Werner, and W. Brutting, Org. Electron. 1, 21 (2000).
17. E. J. Lous, P. W. M. Blom, L. W. Molenkamp, and D. M. de Leeuw, Phys. Rev. B 51, 17251 (1995).
18. D. M. Taylor and H. L. Gomes, J. Phys. D 28, 2554 (1995).