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Volumn , Issue , 1998, Pages 312-315

A circuit for the correction of pixel defects in image sensors

Author keywords

[No Author keywords available]

Indexed keywords

ANALOG DOMAIN; CMOS IMAGE SENSOR; PIXEL DEFECTS; PIXEL RATE; READOUT ELECTRONICS; UPPER AND LOWER BOUNDS; VIDEO SIGNAL;

EID: 34548260590     PISSN: 19308833     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ESSCIR.1998.186271     Document Type: Conference Paper
Times cited : (9)

References (4)
  • 1
    • 84893745619 scopus 로고
    • Kluwer Academic Publishers, Solid-state science and technology library, Eindhoven
    • A. Theuwissen, Solid-stale Imaging with Cliarge-Coupled Devices, Kluwer Academic Publishers, Solid-state science and technology library, Eindhoven, 1995
    • (1995) Solid-stale Imaging with Cliarge-Coupled Devices
    • Theuwissen, A.1
  • 2
    • 0031249402 scopus 로고    scopus 로고
    • Cmos image sensors: Electronic camera-on-A-chip
    • E. Fossum, "CMOS Image Sensors: Electronic Camera-On-A-Chip", IEEE Trans. Electron Devices, vol. 44, pp. 16891698, 1997
    • (1997) IEEE Trans. Electron Devices , vol.44 , pp. 16891698
    • Fossum, E.1
  • 4
    • 0032403659 scopus 로고    scopus 로고
    • CMOS active pixel image sensor with CCD performance
    • Zurich, 18-21 may
    • G. Meynants, B. Dierickx and D. Scheffer, "CMOS active pixel image sensor with CCD performance", AFPAEC conference, Proc. SPIE, vol. 3410, Zurich, 18-21 may 1998
    • (1998) AFPAEC Conference, Proc. SPIE , vol.3410
    • Meynants, G.1    Dierickx, B.2    Scheffer, D.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.