A two-step procedure for characterizing obstacles under a rough surface from bistatic measurements

IEEE Transactions on Geoscience and Remote Sensing

Volumn 45, Issue 9, 2007, Pages 2850-2858

  Cmielewski, Octavien ^b,c   Hervé, Tortel ^b   Litman, Amélie ^a,b   Saillard, Marc ^a,d  

^a IEEE

^b CNRS   (France)

^c Saint Denis

^d UNIVERSITÉ DE TOULON   (France)

Author keywords

Correlation; Electromagnetic scattering; Inverse problems; Rough surfaces; Shape optimization

Indexed keywords

COMPUTER SIMULATION; ELECTROMAGNETIC WAVE SCATTERING; INVERSE PROBLEMS; ITERATIVE METHODS; PERTURBATION TECHNIQUES; SHAPE OPTIMIZATION; SURFACE ROUGHNESS;

BISTATIC MEASUREMENTS; BOUNDARY INTEGRAL SOLVER; ELECTROMAGNETIC DETECTION;

OBJECT RECOGNITION;

EID: 34548212269     PISSN: 01962892     EISSN: None     Source Type: Journal    
DOI: 10.1109/TGRS.2007.902289     Document Type: Article

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