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Volumn T115, Issue , 2005, Pages 925-927
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XAFS study of local structure with picometer accuracy: Th 1-xUxO2 and Th1-xPu xO2 solid solutions
c
CEA Marcoule
(France)
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Author keywords
[No Author keywords available]
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Indexed keywords
CRYSTAL ATOMIC STRUCTURE;
ELECTRONIC STRUCTURE;
LATTICE CONSTANTS;
METAL IONS;
SYNCHROTRON RADIATION;
X RAY DIFFRACTION;
MIXED OXIDE STRUCTURE;
PICO-METER BARRIER;
VEGARD'S LAW;
VIRTUAL CRYSTAL APPROXIMATION (VCA);
X RAY ABSORPTION FINE STRUCTURE SPECTROSCOPY;
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EID: 34548135077
PISSN: 02811847
EISSN: None
Source Type: Conference Proceeding
DOI: 10.1238/Physica.Topical.115a00925 Document Type: Article |
Times cited : (8)
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References (17)
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