메뉴 건너뛰기




Volumn , Issue , 2007, Pages 740-744

Energy dissipation in folded-beam MEMS resonators made from singleCrystal and poly crystalline 3C-SiC films

Author keywords

3C SiC; Quality factor; Resonator

Indexed keywords

CHEMICAL VAPOR DEPOSITION; ENERGY DISSIPATION; MEMS; POLYCRYSTALLINE MATERIALS; Q FACTOR MEASUREMENT; SILICON CARBIDE; SINGLE CRYSTALS;

EID: 34548120188     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/NEMS.2007.352124     Document Type: Conference Paper
Times cited : (10)

References (15)
  • 1
    • 36449003431 scopus 로고
    • Epitaxial growth of 3C-SiC films on 4 in. diam (100) silicon wafers by atmospheric pressure chemical vapor deposition
    • C.A. Zorman, A.J. Fleischman, A.S. Dewa, M. Mehregany, C. Jacob, S. Nishino, P. Pirouz, "Epitaxial growth of 3C-SiC films on 4 in. diam (100) silicon wafers by atmospheric pressure chemical vapor deposition," J. Appl. Phys., vol. 78, 1995, pp. 5136-5138
    • (1995) J. Appl. Phys , vol.78 , pp. 5136-5138
    • Zorman, C.A.1    Fleischman, A.J.2    Dewa, A.S.3    Mehregany, M.4    Jacob, C.5    Nishino, S.6    Pirouz, P.7
  • 2
    • 84944750987 scopus 로고    scopus 로고
    • Fabrication and Testing of Single Crystalline 3C-SiC Devices Using a Novel SiC-on-Insulator Substrate Dig. of Tech
    • Papers, the 12, Boston, MA, June 8-12
    • H.-I. Kuo, CA. Zorman, M. Mehregany, "Fabrication and Testing of Single Crystalline 3C-SiC Devices Using a Novel SiC-on-Insulator Substrate" Dig. of Tech. Papers, the 12, Int. Conf. on Solid-State Sensors & Actuators, Boston, MA, June 8-12, 2003, pp. 742-745
    • (2003) Int. Conf. on Solid-State Sensors & Actuators , pp. 742-745
    • Kuo, H.-I.1    Zorman, C.A.2    Mehregany, M.3
  • 3
    • 17244379776 scopus 로고    scopus 로고
    • Polycrystalline 3C-SiC thin films deposited by dual precursor LPCVD for MEMS applications
    • X. A. Fu, J. Dunning, C A. Zorman, M. Mehregany, "Polycrystalline 3C-SiC thin films deposited by dual precursor LPCVD for MEMS applications," Sensors and Actuators A, vol. 119, 2005, pp. 169-176
    • (2005) Sensors and Actuators A , vol.119 , pp. 169-176
    • Fu, X.A.1    Dunning, J.2    Zorman, C.A.3    Mehregany, M.4
  • 4
    • 0002614116 scopus 로고
    • Dependence of the quality factor of micromachined silicon beam resonators on pressure and geometry
    • F.R. Blom, S. Bouwstra, M. Elwenspoek, and J.H. J. Fiuitman, "Dependence of the quality factor of micromachined silicon beam resonators on pressure and geometry," J. Vac. Sci. Tech., B, vol. 10(1), 1992, pp. 19-26
    • (1992) J. Vac. Sci. Tech., B , vol.10 , Issue.1 , pp. 19-26
    • Blom, F.R.1    Bouwstra, S.2    Elwenspoek, M.3    Fiuitman, J.H.J.4
  • 5
    • 0029327386 scopus 로고
    • Q-Factor Dependence of One-Port Encapsulated Polysilicon Resonator on Reactive Sealing Pressure
    • C. Gui, R. Legtenberg, M. Elwenspoek, J.H. Fluitman, "Q-Factor Dependence of One-Port Encapsulated Polysilicon Resonator on Reactive Sealing Pressure," J. Micromech. Microeng. vol. 5, 1995, pp. 183-185
    • (1995) J. Micromech. Microeng , vol.5 , pp. 183-185
    • Gui, C.1    Legtenberg, R.2    Elwenspoek, M.3    Fluitman, J.H.4
  • 7
    • 0000018940 scopus 로고    scopus 로고
    • Thermoelastic damping in micro- and nanomechanical systems
    • R. Lifshitz, M.L. Roukes, "Thermoelastic damping in micro- and nanomechanical systems," Phys. Rev. B, vol. 61, 2000, pp. 5600-5609
    • (2000) Phys. Rev. B , vol.61 , pp. 5600-5609
    • Lifshitz, R.1    Roukes, M.L.2
  • 9
    • 0018504421 scopus 로고
    • Measurement of heat capacity of semiconducting materials by direct heating pulse method at high temperatures
    • Aug
    • K. Naito, H. Inaba, M. Ishida, K. Seta, "Measurement of heat capacity of semiconducting materials by direct heating pulse method at high temperatures" Journal of Physics E - Scientific Instruments, vol. 12, Aug. 1979, pp. 712-718
    • (1979) Journal of Physics E - Scientific Instruments , vol.12 , pp. 712-718
    • Naito, K.1    Inaba, H.2    Ishida, M.3    Seta, K.4
  • 11
    • 0345063570 scopus 로고    scopus 로고
    • Characterization of Mechanical Properties of Cubic Silicon Carbide Thin Films Deposited onto Silicon,
    • MS Thesis, Case Western Reserve University, Cleveland
    • J.S. Mitchell, "Characterization of Mechanical Properties of Cubic Silicon Carbide Thin Films Deposited onto Silicon," MS Thesis, Case Western Reserve University, Cleveland, 2001
    • (2001)
    • Mitchell, J.S.1
  • 12
    • 0010419466 scopus 로고
    • Grain size dependence of the thermal conductivity of polycrystalline chemical vapor deposited beta -SiC at low temperatures
    • A.K. Collins, M.A. Pickering, R.L. Taylor., "Grain size dependence of the thermal conductivity of polycrystalline chemical vapor deposited beta -SiC at low temperatures," J. Appl. Phys., vol.68[12] 1990, pp. 6510-6512
    • (1990) J. Appl. Phys , vol.68 , Issue.12 , pp. 6510-6512
    • Collins, A.K.1    Pickering, M.A.2    Taylor, R.L.3
  • 13
    • 0015375223 scopus 로고
    • Thermal expansion at elevated temperatures III. A hemispherical laminar composite of pyrolytic graphite, silicon carbide and its constituents between 300 and 800 K
    • A.F. Pojur, B. Yates, B.T. Kelly, "Thermal expansion at elevated temperatures III. A hemispherical laminar composite of pyrolytic graphite, silicon carbide and its constituents between 300 and 800 K," J. Phys. D: Applied Physics, vol. 5, 1972, pp. 1321-1329
    • (1972) J. Phys. D: Applied Physics , vol.5 , pp. 1321-1329
    • Pojur, A.F.1    Yates, B.2    Kelly, B.T.3
  • 14
    • 34548108695 scopus 로고    scopus 로고
    • Development of Low-Stress, Undoped Poly-SiC Films in a Large-Scale LPCVD Furnace Using Gas Flow as Controlling Parameter,
    • M.S. Thesis, Case Western Reserve University, Cleveland
    • J. Dunning, "Development of Low-Stress, Undoped Poly-SiC Films in a Large-Scale LPCVD Furnace Using Gas Flow as Controlling Parameter," M.S. Thesis, Case Western Reserve University, Cleveland, 2005
    • (2005)
    • Dunning, J.1
  • 15
    • 0023430314 scopus 로고
    • The Effect of Low Pressure on the Structure of LPCVD Polycrystalline Silicon Films
    • P. Joubert, B. Loisel, Y. Chouan, "The Effect of Low Pressure on the Structure of LPCVD Polycrystalline Silicon Films," J. Electrochem. Soc. vol.134, 1987, pp. 2541-2545
    • (1987) J. Electrochem. Soc , vol.134 , pp. 2541-2545
    • Joubert, P.1    Loisel, B.2    Chouan, Y.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.