Characterization of a subwavelength-scale 3D void structure using the FDTD-based confocal laser scanning microscopic image mapping technique

Optics Express

Volumn 15, Issue 17, 2007, Pages 10767-10781

  Choi, Kyongsik ^a   Chon, James W M ^a   Gu, Min ^a   Lee, Byoungho ^b  

^a SWINBURNE UNIVERSITY OF TECHNOLOGY   (Australia)

^b Seoul National University   (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

BOUNDARY CONDITIONS; FINITE DIFFERENCE METHOD; GAUSSIAN BEAMS; POLYMER MATRIX; TIME DOMAIN ANALYSIS;

ANGULAR SPECTRUM ANALYSIS; CONFOCAL LASER SCANNING MICROSCOPY (CLSM); OPTICAL TRAPPING; TOPOLOGICAL SHAPE FACTOR;

IMAGE ANALYSIS;

EID: 34548093329     PISSN: None     EISSN: 10944087     Source Type: Journal    
DOI: 10.1364/OE.15.010767     Document Type: Article

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