Corrugated metal-coated tapered tip for scanning near-field optical microscope

Optics Express

Volumn 15, Issue 17, 2007, Pages 10920-10928

  Antosiewicz, Tomasz J ^a   Szoplik, Tomasz ^a  

^a UNIVERSITY OF WARSAW   (Poland)

Author keywords

[No Author keywords available]

Indexed keywords

FINITE DIFFERENCE METHOD; NEAR FIELD SCANNING OPTICAL MICROSCOPY; TIME DOMAIN ANALYSIS; WAVELENGTH;

CARTESIAN COORDINATES; ENERGY THROUGHPUT; PARALLEL GROOVES; SCANNING NEAR-FIELD MICROSCOPE;

COATED MATERIALS;

EID: 34548092493     PISSN: None     EISSN: 10944087     Source Type: Journal    
DOI: 10.1364/OE.15.010920     Document Type: Article

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