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Volumn 91, Issue 7, 2007, Pages

Influence of crystallographic steps on properties of ferroelectric ultrathin films: An ab initio study

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTALLOGRAPHY; FERROELECTRIC FILMS; FILM THICKNESS; MORPHOLOGY;

EID: 34548039504     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2770764     Document Type: Article
Times cited : (13)

References (31)
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    • 0031-9007 10.1103/PhysRevLett.73.1861
    • W. Zhong, D. Vanderbilt, and K. M. Rabe, Phys. Rev. Lett. 0031-9007 10.1103/PhysRevLett.73.1861 73, 1861 (1994); W. Zhong, D. Vanderbilt, and K. M. Rabe, Phys. Rev. B 52, 6301 (1995).
    • (1994) Phys. Rev. Lett. , vol.73 , pp. 1861
    • Zhong, W.1    Vanderbilt, D.2    Rabe, K.M.3
  • 20
    • 33746213882 scopus 로고
    • W. Zhong, D. Vanderbilt, and K. M. Rabe, Phys. Rev. Lett. 0031-9007 10.1103/PhysRevLett.73.1861 73, 1861 (1994); W. Zhong, D. Vanderbilt, and K. M. Rabe, Phys. Rev. B 52, 6301 (1995).
    • (1995) Phys. Rev. B , vol.52 , pp. 6301
    • Zhong, W.1    Vanderbilt, D.2    Rabe, K.M.3
  • 21
    • 0000255502 scopus 로고    scopus 로고
    • 0031-9007 10.1103/PhysRevLett.84.5427
    • L. Bellaiche, A. García, and D. Vanderbilt, Phys. Rev. Lett. 0031-9007 10.1103/PhysRevLett.84.5427 84, 5427 (2000); L. Bellaiche, A. García, and D. Vanderbilt, Ferroelectrics 266, 41 (2002).
    • (2000) Phys. Rev. Lett. , vol.84 , pp. 5427
    • Bellaiche, L.1    García, A.2    Vanderbilt, D.3
  • 22
    • 0041951768 scopus 로고    scopus 로고
    • L. Bellaiche, A. García, and D. Vanderbilt, Phys. Rev. Lett. 0031-9007 10.1103/PhysRevLett.84.5427 84, 5427 (2000); L. Bellaiche, A. García, and D. Vanderbilt, Ferroelectrics 266, 41 (2002).
    • (2002) Ferroelectrics , vol.266 , pp. 41
    • Bellaiche, L.1    García, A.2    Vanderbilt, D.3
  • 24
    • 34548033655 scopus 로고    scopus 로고
    • cond-mat/0505497
    • I. I. Naumov and H. Fu, e-print cond-mat/0505497, 2005.
    • (2005)
    • Naumov, I.I.1    Fu, H.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.