High-temperature crystallization and X-ray characterization of Y2SiO5, Y2Si2O7 and LaBSiO5

Journal of Crystal Growth

Volumn 205, Issue 3, 1999, Pages 361-367

  Leonyuk, N I ^a   Belokoneva, E L ^a   Bocelli, G ^b   Righi, L ^b   Shvanskii, E V ^a   Henrykhson, R V ^a   Kulman, N V ^a   Kozhbakhteeva, D E ^a  

^a MOSCOW STATE UNIVERSITY   (Russian Federation)

^b Ctro Stud per Strutturistica D   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTAL STRUCTURE; ELECTRON MICROSCOPY; HIGH TEMPERATURE EFFECTS; LASERS; PHOSPHORS; SILICATES; SINGLE CRYSTALS; X RAY CRYSTALLOGRAPHY;

CHROMIUM DOPED YTTRIUM OXYORTHOSILICATE; ELECTRON MICROPROBE ANALYSIS; LANTHANUM BOROSILICATE; STRUCTURE REFINEMENT; YTTRIUM PYROSILICATE;

CRYSTAL GROWTH FROM MELT;

EID: 0032598139     PISSN: 00220248     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0022-0248(99)00233-X     Document Type: Article

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