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Volumn 76, Issue 8, 2007, Pages

Sensitivity to hole doping of Cu L3 resonant spectroscopies: Inelastic x-ray scattering and photoemission of La2-x Srx Cu O4

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EID: 34547989617     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.76.085116     Document Type: Article
Times cited : (15)

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