Spatiotemporal surface charge measurement in two types of dielectric barrier discharges using Pockels effect

Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers

Volumn 45, Issue 10 B, 2006, Pages 8256-8259

  Abolmasov, Sergey N ^a,b   Abo, Rei ^a   Shirafuji, Tatsuru ^a   Tachibana, Kunihide ^a  

^a KYOTO UNIVERSITY   (Japan)

^b TOHOKU UNIVERSITY   (Japan)

Author keywords

BSO; Dielectric barrier discharge; Electro optical method; Pockels effect; Surface charge

Indexed keywords

ELECTROOPTICAL MATERIALS; OPTICAL RESOLVING POWER; PRESSURE EFFECTS;

DIELECTRIC BARRIER DISCHARGE; POCKELS EFFECT;

SURFACE CHARGE;

EID: 34547912921     PISSN: 00214922     EISSN: 13474065     Source Type: Journal    
DOI: 10.1143/JJAP.45.8255     Document Type: Article

References (17)

1. U. Kogelschatz: Plasma Chem. Plasma Process. 23 (2003) 1.
2. V. I. Gibalov and G. J. Pietsch: J. Phys. D 33 (2000) 2618.
3. U. Kogelschatz: IEEE Trans. Plasma Sci. 30 (2002) 1400.
4. K. Sugimoto, H. Takahashi, O. Shimomura and T. Sakurai: J. Phys. D 36 (2003) 2887.
5. D. C. Jeong, H. S. Bae and K. W. Whang: J. Appl. Phys. 97 (2005) 013304.
6. A. Yariv and P. Yeh: Optical Waves in Crystals (Wiley, New York, 1984).
7. S. Huard: Polarization of Light (Wiley, New York, 1997).
8. W. G. Driscoll and W. Vaugham: Handbook of Optics (McGraw-Hill, New York, 1978).
9. K. V. Kozlov, P. Michel and H. E. Wagner: Czech. J. Phys. 48 (1998) 1199.
10. S. N. Abolmasov, T. Shirafuji and K. Tachibana: Proc. 17th Int. Conf. Plasma Chemistry, Toronto, 2005, IEEE Trans. Plasma Sci. 33 (2005) 941.
11. S. N. Abolmasov: 2003 Annu. Rep. Kyoto Univ.-VBL (2004) p. 62.
12. L. D. Goldshtein and N. V. Zemov: Electromagnetic Fields and Waves (Sovetskoe Radio, Moscow, 1956) [in Russian].
13. H. E. Wagner, R. Brandenburg, K. V. Kozlov, A. Sonnenfeld, P. Michel and J. F. Behnke: Vacuum 71 (2003) 417.
14. Z. Falkenstein and J. J. Googan: J. Phys. D 30 (1997) 817.
15. V. V. Osipov: Phys. Usp. 43 (2000) 221.
16. L. Mangolini, C. Anderson, J. Heberlein and U. Kortshagen: J. Phys. D 37 (2004) 1021.
17. Y. L. Sam, P. L. Lewin, A. E. Davies, J. S. Wilkinson, S. J. Sutton and S. G. Swingler: IEE Proc.-Sci. Meas. Technol. 150 (2003) 43.