Surface discharge measurements of polymeric materials

IEE Proceedings: Science, Measurement and Technology

Volumn 150, Issue 2, 2003, Pages 43-52

  Sam, Y L ^a   Lewin, P L ^a   Davies, A E ^a   Wilkinson, J S ^a   Sutton, S J ^b   Swingler, S G ^b  

^a UNIVERSITY OF SOUTHAMPTON   (United Kingdom)

^b NATIONAL GRID   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

CHARGE COUPLED DEVICES; ELECTRIC FIELDS; ELECTRIC INSULATING MATERIALS; ELECTRIC VARIABLES MEASUREMENT; HIGH SPEED CAMERAS; LIGHT MODULATORS; NONDESTRUCTIVE EXAMINATION; ONLINE SYSTEMS; POLYMERS; SENSITIVITY ANALYSIS; SILICON SENSORS; SILICON WAFERS;

BISMUTH SILICON OXIDE; OPTICAL PHASE MODULATOR; POCKELS EFFECT; SURFACE DISCHARGE MEASUREMENT; SYNCHRONIZATION CONTROL CIRCUIT;

SURFACE DISCHARGES;

EID: 0038359372     PISSN: 13502344     EISSN: None     Source Type: Journal    
DOI: 10.1049/ip-smt:20030297     Document Type: Article

References (15)

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