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Volumn 46, Issue 1, 2007, Pages 211-216
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Calibration of the thermal conductivity of thin films in phase-change optical-recording stacks
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Author keywords
Numerical modeling; Phase change recording; Thermal conductivity calibration; Thermal simulation; Transmission electron microscope (TEM)
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Indexed keywords
MATHEMATICAL MODELS;
NUMERICAL METHODS;
THERMAL EFFECTS;
TRANSMISSION ELECTRON MICROSCOPY;
PHASE CHANGE RECORDING;
THERMAL CONDUCTIVITY CALIBRATION;
THERMAL SIMULATION;
THIN FILMS;
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EID: 34547909297
PISSN: 00214922
EISSN: 13474065
Source Type: Journal
DOI: 10.1143/JJAP.46.211 Document Type: Article |
Times cited : (3)
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References (9)
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