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Volumn 46, Issue 1, 2007, Pages 211-216

Calibration of the thermal conductivity of thin films in phase-change optical-recording stacks

Author keywords

Numerical modeling; Phase change recording; Thermal conductivity calibration; Thermal simulation; Transmission electron microscope (TEM)

Indexed keywords

MATHEMATICAL MODELS; NUMERICAL METHODS; THERMAL EFFECTS; TRANSMISSION ELECTRON MICROSCOPY;

EID: 34547909297     PISSN: 00214922     EISSN: 13474065     Source Type: Journal    
DOI: 10.1143/JJAP.46.211     Document Type: Article
Times cited : (3)

References (9)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.