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Volumn 52, Issue 27 SPEC. ISS., 2007, Pages 7689-7696

Application of Volta potential mapping to determine metal surface defects

Author keywords

Dislocations; Passivity; Stress; Volta potential

Indexed keywords

DISLOCATIONS (CRYSTALS); FATIGUE CRACK PROPAGATION; INCLUSIONS; PITTING; SCANNING PROBE MICROSCOPY; WORK FUNCTION;

EID: 34547904647     PISSN: 00134686     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.electacta.2007.05.077     Document Type: Article
Times cited : (77)

References (34)
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  • 32
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.