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Volumn 52, Issue 27 SPEC. ISS., 2007, Pages 7689-7696
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Application of Volta potential mapping to determine metal surface defects
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Author keywords
Dislocations; Passivity; Stress; Volta potential
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Indexed keywords
DISLOCATIONS (CRYSTALS);
FATIGUE CRACK PROPAGATION;
INCLUSIONS;
PITTING;
SCANNING PROBE MICROSCOPY;
WORK FUNCTION;
METAL ELECTRON WORK FUNCTION;
PASSIVITY;
SCANNING KELVIN PROBE;
VOLTA POTENTIAL;
SURFACE DEFECTS;
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EID: 34547904647
PISSN: 00134686
EISSN: None
Source Type: Journal
DOI: 10.1016/j.electacta.2007.05.077 Document Type: Article |
Times cited : (77)
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References (34)
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