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Volumn 45, Issue 11, 2006, Pages 8592-8596
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Control of compositional profile and crystallinity of CuIn 1-xAlxS2 thin films
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Author keywords
Band gap; CuIn1 xAlxS2; Depth profile; Lattice constants; Sulfurization; Thin film
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Indexed keywords
BOROSILICATE GLASS;
COPPER ALLOYS;
CRYSTAL STRUCTURE;
EVAPORATION;
LATTICE CONSTANTS;
CRYSTALLINITY;
DEPTH PROFILE;
SULFURIZATION;
SULFURIZATION TEMPERATURE;
THIN FILMS;
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EID: 34547891073
PISSN: 00214922
EISSN: 13474065
Source Type: Journal
DOI: 10.1143/JJAP.45.8592 Document Type: Article |
Times cited : (5)
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References (20)
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