Cover-layer with high refractive index for near-field recording media

Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers

Volumn 46, Issue 6 B, 2007, Pages 3993-3996

  Kim, Jin Hong ^a   Lee, Jun Seok ^a  

^a LG Electronics Inc   (South Korea)

Author keywords

Cover layer; High refractive index; Nanoparticle; Near field recording; Numerical aperture; Surface roughness; UV curable resin

Indexed keywords

NANOPARTICLES; REFRACTIVE INDEX; RESINS; SURFACE ROUGHNESS; ULTRAVIOLET RADIATION;

COVER-LAYERS; NEAR-FIELD RECORDING; NUMERICAL APERTURE; OPTICAL HEAD;

OPTICAL RECORDING;

EID: 34547868204     PISSN: 00214922     EISSN: 13474065     Source Type: Journal    
DOI: 10.1143/JJAP.46.3993     Document Type: Article

References (12)

1. T. Nishihara, R. Kojima, N. Miyagawa, and N. Yamada: Jpn. J. Appl. Phys. 44 (2005) 3037.
2. N. Ohmachi, S. Ashida, K. Yusu, T. Nakai, K. Ichihara, and N. Nakamura: Jpn. J. Appl. Phys. 43 (2004) 4978.
3. M. Shinoda, K. Saito, T. Ishimoto, T. Kondo, A. Nakaoki, N. Ide, M. Furuki, M. Takeda, Y. Akiyama, T. Shimouma, and M. Yamamoto: Jpn. J. Appl. Phys. 44 (2005) 3537.
4. K. T. Arai, K. Kurihara, T. Nakano, J. Tominaga, and C. Rockstuhl: Appl. Phys. Lett. 88 (2006) 051104.
5. Y. Tomita, K. Furushima, K. Ochi, and K. Ishizu: Appl. Phys. Lett. 88 (2006) 071103.
6. B. D. Terris, H. J. Mamin, D. Rugar, W. R. Studenmund, and G. S. Kino: Appl. Phys. Lett. 65 (1994) 388.
7. T. Ishimoto, K. Saito, M. Shinoda, T. Kondo, A. Nakaoki, and M. Yamamoto: Jpn. J. Appl. Phys. 42 (2003) 2719.
8. J.-H. Rim, D.-E. Kim, and H.-J. Kang: Jpn. J. Appl. Phys. 42 (2003) 2746.
9. T. Yamasaki, T. Yukumoto, S. Kim, T. Ishimoto, N. Ariyoshi, F.-K. Bruder, R. Oser, and K. Hildenbrand: ISOM. Tech. Dig., 2006, p. 284.
10. J. M. A. van den Eerenbeemd, D. M. Bruis, C. A. Versvhuren, and F. Zijp: ISOM Tech. Dig., 2006, p. 66.
11. M. Ro, K. Lee, C. Park, H. Park, and I. Park: Jpn. J. Appl. Phys. 44 (2005) 3601.
12. M. H. Kryder: J. Appl. Phys. 57 (1985) 3913.