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Volumn 91, Issue 6, 2007, Pages
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Dynamic process of dendrite fragmentation in solidification from undercooled Si melt using time-resolved x-ray diffraction
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Author keywords
[No Author keywords available]
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Indexed keywords
SILICON;
SOLIDIFICATION;
X RAY DIFFRACTION ANALYSIS;
CURRENT QUANTITATIVE PREDICTION;
DENDRITE FRAGMENTATION;
RECALESCENCE;
SUBSEQUENT TRANSITION;
DENDRITES (METALLOGRAPHY);
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EID: 34547829353
PISSN: 00036951
EISSN: None
Source Type: Journal
DOI: 10.1063/1.2764114 Document Type: Article |
Times cited : (6)
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References (15)
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