Real-time x-ray observation of solidification from undercooled Si melt

Journal of Applied Physics

Volumn 100, Issue 3, 2006, Pages

  Nagashio, K ^a   Adachi, M ^b   Higuchi, K ^b   Mizuno, A ^b   Watanabe, M ^b   Kuribayashi, K ^a   Katayama, Y ^c  

^a JAPAN AEROSPACE EXPLORATION AGENCY   (Japan)

^b GAKUSHUIN UNIVERSITY   (Japan)

^c JAPAN ATOMIC ENERGY AGENCY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTAL MICROSTRUCTURE; MOLTEN MATERIALS; SEMICONDUCTOR MATERIALS; SOLIDIFICATION; X RAY DIFFRACTION ANALYSIS;

DENDRITES; DIFFRACTION PATTERN; GRAIN REFINED MICROSTRUCTURES; UNDERCOOLINGS;

SILICON;

EID: 33747367194     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2210267     Document Type: Article

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