Real-time, micrometer depth-resolved imaging by low-coherence reflectometry and a two-dimensional heterodyne detection technique

Japanese journal of applied physics

Volumn 39, Issue 11 B, 2000, Pages

  Akiba, Masahiro ^a,b   Chan, Kin Pui ^a,b   Tanno, Naohiro ^a,b  

^a JAPAN SCIENCE AND TECHNOLOGY AGENCY   (Japan)

^b YAMAGATA UNIVERSITY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

CAMERAS; COHERENT LIGHT; HETERODYNING; MICROMETERS; REFLECTOMETERS;

FREQUENCY SYNCHRONOUS DETECTIONS;

IMAGING TECHNIQUES;

EID: 0034318705     PISSN: 00214922     EISSN: None     Source Type: Journal    
DOI: 10.1143/jjap.39.l1194     Document Type: Article

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