Infrared reflectance spectroscopy on thin films: Interference effects

Icarus

Volumn 190, Issue 1, 2007, Pages 274-279

  Teolis, B D ^a   Loeffler, M J ^a   Raut, U ^a   Fama M ^a   Baragiola, R A ^a  

^a University of Virginia   (United States)

Author keywords

Experimental techniques; Ices; IR spectroscopy

Indexed keywords

EID: 34547793777     PISSN: 00191035     EISSN: 10902643     Source Type: Journal    
DOI: 10.1016/j.icarus.2007.03.023     Document Type: Article

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