Film growth of ice by vapor deposition at 128-185 K studied by Fourier transform infrared reflection-absorption spectroscopy: Evolution of the oh stretch and the dangling bond with film thickness

Journal of Physical Chemistry B

Volumn 106, Issue 24, 2002, Pages 6234-6247

  Mitlin, S ^a   Leung, K T ^a  

^a UNIVERSITY OF WATERLOO   (Canada)

Author keywords

[No Author keywords available]

Indexed keywords

POLYCRYSTALLINE ICE FILMS;

ABSORPTION SPECTROSCOPY; CHEMICAL BONDS; COMPUTER SIMULATION; DIELECTRIC FILMS; FOURIER TRANSFORM INFRARED SPECTROSCOPY; ICE; LIGHT ABSORPTION; LIGHT POLARIZATION; LIGHT REFLECTION; POLYCRYSTALLINE MATERIALS; VACUUM; VAPOR DEPOSITION;

FILM GROWTH;

EID: 0037142712     PISSN: 10895647     EISSN: None     Source Type: Journal    
DOI: 10.1021/jp0142841     Document Type: Article

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