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Volumn 136, Issue , 2007, Pages 329-343

The effect of oxygen-containing reagents on the crystal morphology and orientation in tungsten oxide thin films deposited via atmospheric pressure chemical vapour deposition (APCVD) on glass substrates

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EID: 34547782711     PISSN: 13596640     EISSN: 13645498     Source Type: Journal    
DOI: 10.1039/b615877c     Document Type: Article
Times cited : (17)

References (21)
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    • Kirss, R.U.1    Meda, L.2
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    • Parametric analysis of control parameters in MOCVD
    • R. J. Betsch Parametric analysis of control parameters in MOCVD J. Cryst. Growth 1986 77 1-3 210 218
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    • Betsch, R.J.1
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    • Photooxidative self-cleaning transparent titanium-dioxide films on glass
    • Y. Paz Z. Luo L. Rabenberg A. Heller Photooxidative self-cleaning transparent titanium-dioxide films on glass J. Mater. Res. 1995 10 11 2842 2848
    • (1995) J. Mater. Res. , vol.10 , Issue.11 , pp. 2842-2848
    • Paz, Y.1    Luo, Z.2    Rabenberg, L.3    Heller, A.4
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    • 3-type with recurrent dislocations of atoms - Homologous series of molybdenum and tungsten oxides
    • 3-type with recurrent dislocations of atoms - homologous series of molybdenum and tungsten oxides Acta Crystallogr. 1953 6 6 495 500
    • (1953) Acta Crystallogr. , vol.6 , Issue.6 , pp. 495-500
    • Magneli, A.1
  • 18
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    • 2 thin films deposited by chemical vapor deposition
    • 2 thin films deposited by chemical vapor deposition J. Am. Chem. Soc. 2006 128 37 12147 12155
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    • Hyett, G.1    Green, M.2    Parkin, I.P.3
  • 19
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    • Correction of intensities for preferred orientation in powder diffractometry - Application of the March model
    • W. A. Dollase Correction of intensities for preferred orientation in powder diffractometry - application of the March model J. Appl. Crystallogr. 1986 19 267 272
    • (1986) J. Appl. Crystallogr. , vol.19 , pp. 267-272
    • Dollase, W.A.1


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