|
Volumn 579, Issue 2 SPEC. ISS., 2007, Pages 782-787
|
Systematic study of micro-discharge characteristics of ATLAS barrel silicon microstrip modules
|
Author keywords
ATLAS; Hot electron; Micro discharge; SCT; Silicon microstrip
|
Indexed keywords
INFRARED IMAGING;
LEAKAGE CURRENTS;
MICROSTRIP DEVICES;
QUALITY ASSURANCE;
SENSITIVITY ANALYSIS;
HOT SPOT LOCALIZATION;
QUALITY ASSURANCE TESTING;
SILICON MICROSTRIP MODULES;
SILICON DETECTORS;
|
EID: 34547772715
PISSN: 01689002
EISSN: None
Source Type: Journal
DOI: 10.1016/j.nima.2007.05.288 Document Type: Article |
Times cited : (3)
|
References (6)
|