On the false-positive rate of statistical equipment comparisons based on the kruskal-wallis H statistic

IEEE Transactions on Semiconductor Manufacturing

Volumn 20, Issue 3, 2007, Pages 286-292

  De Vries, Dirk K ^a,b   Chandon, Yves ^c  

^a IEEE

^b NXP SEMICONDUCTORS   (France)

^c FREESCALE SEMICONDUCTOR INC   (United States)

Author keywords

ANOVA; Beta approximation; Chi square; Commonality analysis; Kruskal Wallis test; Mann whitney; Nonparametric tests; Wilcoxon rank sum test

Indexed keywords

APPROXIMATION THEORY; COMPUTER SIMULATION; STATISTICAL TESTS;

BETA APPROXIMATION; CHI-SQUARE; COMMONALITY ANALYSIS; KRUSKAL-WALLIS TEST; MANN-WHITNEY; NONPARAMETRIC TESTS; WILCOXON RANK SUM TEST;

SEMICONDUCTOR DEVICE MANUFACTURE;

EID: 34547766458     PISSN: 08946507     EISSN: None     Source Type: Journal    
DOI: 10.1109/TSM.2007.901398     Document Type: Conference Paper

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