High-resolution X-ray mapping of CdZnTe detectors

Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment

Volumn 579, Issue 1, 2007, Pages 120-124

  Carini, G A ^a   Bolotnikov, A E ^a   Camarda, G S ^a   James, R B ^a  

^a BROOKHAVEN NATIONAL LABORATORY   (United States)

Author keywords

CdZnTe; Radiation detectors; Te inclusions; X ray mapping

Indexed keywords

CADMIUM COMPOUNDS; DEFECTS; ELECTRIC CHARGE; MICROSCOPIC EXAMINATION; SEMICONDUCTOR DETECTORS; SYNCHROTRON RADIATION; TRANSPORT PROPERTIES;

TE INCLUSIONS; X-RAY MAPPING;

RADIATION DETECTORS;

EID: 34547697820     PISSN: 01689002     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.nima.2007.04.078     Document Type: Article

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