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Volumn 579, Issue 1, 2007, Pages 252-255

Neutron-induced soft error rate measurements in semiconductor memories

Author keywords

Accelerated soft error testing; Neutron; Nuclear research reactor; SEU; Single event upset; Soft error; Soft error rate (SER)

Indexed keywords

BIT ERROR RATE; HIGH ENERGY PHYSICS; NEUTRON DETECTORS; NEUTRON FLUX; RADIATION EFFECTS;

EID: 34547680443     PISSN: 01689002     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.nima.2007.04.049     Document Type: Article
Times cited : (9)

References (8)
  • 2
    • 34547719017 scopus 로고    scopus 로고
    • D.P. Siewiorek, R.S. Swartz, Reliable Computer Systems: Design and Evaluation, second ed., Digital Press, Burlington, MA.
  • 3
    • 34547712096 scopus 로고    scopus 로고
    • P. Hazucha, T. Karnik, J. Maiz, S. Walstra, B. Bloechel, J. Tschanz, G. Dermer, S. Hareland, P. Armstrong, S. Borkar, IEDM 2003 Technical Digest, 2003, 21.5.1.
  • 4
    • 34547716606 scopus 로고    scopus 로고
    • J. Maiz, S. Hareland, K. Zhang, P. Armstrong, IEDM 2003 Technical Digest, 2003, 21.4.1.
  • 5
    • 0035004322 scopus 로고    scopus 로고
    • N. Seifert, D. Moyer, N. Leland, R. Hokinson, in: IEEE 39th Annual International Reliability Physics Symposium, 2001, p. 259.
  • 6
    • 0036927879 scopus 로고    scopus 로고
    • R. Baumann, IEDM 2002 Technical Digest, 2002, p. 329.
  • 7
    • 34547694855 scopus 로고    scopus 로고
    • V. Degalahal, Ph.D. Thesis, Penn State University, 2005.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.