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Volumn 579, Issue 1, 2007, Pages 252-255
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Neutron-induced soft error rate measurements in semiconductor memories
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Author keywords
Accelerated soft error testing; Neutron; Nuclear research reactor; SEU; Single event upset; Soft error; Soft error rate (SER)
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Indexed keywords
BIT ERROR RATE;
HIGH ENERGY PHYSICS;
NEUTRON DETECTORS;
NEUTRON FLUX;
RADIATION EFFECTS;
ACCELERATED SOFT ERROR TESTING;
NUCLEAR RESEARCH REACTORS;
SINGLE-EVENT UPSET;
SOFT ERROR RATE (SER);
SEMICONDUCTOR DEVICES;
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EID: 34547680443
PISSN: 01689002
EISSN: None
Source Type: Journal
DOI: 10.1016/j.nima.2007.04.049 Document Type: Article |
Times cited : (9)
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References (8)
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