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Volumn 91, Issue 5, 2007, Pages

Charge control analysis of transistor laser operation

Author keywords

[No Author keywords available]

Indexed keywords

CARRIER LIFETIMES; CHARGE CONTROL; TRANSIT TIME;

EID: 34547659169     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2767172     Document Type: Article
Times cited : (102)

References (14)
  • 8
    • 34547693470 scopus 로고    scopus 로고
    • IEEE International Electron Devices Meeting (IEDM), San Francisco, CA, 11-13 Dec.
    • W. Snodgrass, W. Hafez, N. Harff, and M. Feng, IEEE International Electron Devices Meeting (IEDM), San Francisco, CA, 11-13 Dec. 2006.
    • (2006)
    • Snodgrass, W.1    Hafez, W.2    Harff, N.3    Feng, M.4
  • 14
    • 0007301047 scopus 로고
    • Columbia University Press, New York, NY
    • H. Statz and G. deMars, Quantum Electronics (Columbia University Press, New York, NY, 1960), p. 650.
    • (1960) Quantum Electronics , pp. 650
    • Statz, H.1    Demars, G.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.