Combinatorial preparation and characterization of thin-film multilayer electro-optical devices

Review of Scientific Instruments

Volumn 78, Issue 7, 2007, Pages

  Neuber, Christian ^a   Bäte, Markus ^a   Thelakkat, Mukundan ^a   Schmidt, Hans Werner ^a   Hänsel, Helmut ^b   Zettl, Heiko ^b   Krausch, Georg ^b  

^a UNIVERSITY OF BAYREUTH   (Germany)

^b UNIVERSITY OF BAYREUTH   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

CHEMICAL VAPOR DEPOSITION; COMPUTER SOFTWARE; FLUORESCENCE; ORGANIC LIGHT EMITTING DIODES (OLED); THIN FILMS;

AUTOMATION SOFTWARE; EVAPORATION CHAMBER; FIVE-MASK SAMPLER; METALLIC MATERIALS;

ELECTROOPTICAL DEVICES;

ARTICLE; ARTIFICIAL MEMBRANE; COMBINATORIAL CHEMISTRY; CRYSTALLIZATION; ELECTRONICS; EQUIPMENT; EQUIPMENT DESIGN; EVALUATION; INSTRUMENTATION; MATERIALS TESTING; METHODOLOGY; MICROELECTRODE; OPTICS;

COMBINATORIAL CHEMISTRY TECHNIQUES; CRYSTALLIZATION; ELECTRONICS; EQUIPMENT DESIGN; EQUIPMENT FAILURE ANALYSIS; MATERIALS TESTING; MEMBRANES, ARTIFICIAL; MICROELECTRODES; OPTICS;

EID: 34547606817     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2756993     Document Type: Article

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