Phase-change optical recording: Past, present, future

Thin Solid Films

Volumn 515, Issue 19 SPEC. ISS., 2007, Pages 7534-7537

  Kolobov, A V ^a,b   Fons, P ^a   Tominaga, J ^a  

^a NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL SCIENCE AND TECHNOLOGY AIST   (Japan)

^b UNIVERSITÉ DE MONTPELLIER   (France)

Author keywords

Chalcogenides; EXAFS; Phase change memories; XANES

Indexed keywords

CHALCOGENIDES; DATA STORAGE EQUIPMENT; DIFFRACTION; EXTENDED X RAY ABSORPTION FINE STRUCTURE SPECTROSCOPY; OPTICAL RECORDING; PHASE TRANSITIONS;

FACE-CENTERED CUBIC LATTICE; SUPER-RESOLUTION NEAR-FIELD STRUCTURE;

PHASE CHANGE MATERIALS;

EID: 34547592872     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.tsf.2006.11.183     Document Type: Article

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