Structural change of crystalline and amorphous-Ge2Sb 2Te5 by reverse Monte Carlo analysis of x-ray diffraction data and extended x-ray absorption fine structure data

Journal of Physics Condensed Matter

Volumn 19, Issue 33, 2007, Pages

  Arai, T ^a   Sato, M ^b   Umesaki, N ^b  

^a NATIONAL DEFENSE ACADEMY   (Japan)

^b JAPAN SYNCHROTRON RADIATION RESEARCH INSTITUTE   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

AMORPHOUS MATERIALS; COMPUTER SIMULATION; CRYSTALLINE MATERIALS; MOLECULAR DYNAMICS; MONTE CARLO METHODS; SEMICONDUCTING GERMANIUM COMPOUNDS; X RAY ABSORPTION SPECTROSCOPY;

PARTIAL PAIR DISTRIBUTION FUNCTION; REVERSE MONTE CARLO ANALYSIS; STRUCTURAL CHANGES;

THIN FILMS;

EID: 34547464150     PISSN: 09538984     EISSN: 1361648X     Source Type: Journal    
DOI: 10.1088/0953-8984/19/33/335213     Document Type: Article

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