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Volumn 35, Issue 4, 2002, Pages 434-442

X-ray diffraction, neutron scattering and EXAFS spectroscopy of monoclinic zirconia: Analysis by rietveld refinement and reverse Monte Carlo simulations

(3) Winterer, Markus a Delaplane, Robert a McGreevy, Robert a

a DARMSTADT UNIVERSITY OF TECHNOLOGY (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ZIRCONIUM OXIDE;

ABSORPTION SPECTROSCOPY; ACCURACY; ANALYTIC METHOD; ARTICLE; CRYSTAL STRUCTURE; MODEL; MONTE CARLO METHOD; NEUTRON SCATTERING; ROENTGEN SPECTROSCOPY; STRUCTURE ANALYSIS; X RAY DIFFRACTION; X RAY POWDER DIFFRACTION;

EID: 0036049475 PISSN: 00218898 EISSN: None Source Type: Journal
DOI: 10.1107/S0021889802006829 Document Type: Article

Times cited : (60)

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