Timing jitter measurement in single-flux-quantum circuits based on time-to-digital converters with high time-resolution

IEEE Transactions on Applied Superconductivity

Volumn 17, Issue 2, 2007, Pages 552-555

  Terabe, Masayoshi ^a,b   Sekiya, Akito ^a,b   Yamada, Takahiro ^a,b   Fujimaki, Akira ^a,b  

^a NAGOYA UNIVERSITY   (Japan)

^b JAPAN SCIENCE AND TECHNOLOGY AGENCY   (Japan)

Author keywords

Flux qubit; Time to digital converter; Timing jitter

Indexed keywords

COMPARATOR CIRCUITS; DIGITAL CIRCUITS; HELIUM; THERMAL NOISE; TIMING JITTER;

FLUX QUBIT; OPTIMALLY DAMPED SIMPLE JUNCTION; SHUNT RESISTANCE; TIME-TO-DIGITAL CONVERTER (TDC);

JOSEPHSON JUNCTION DEVICES;

EID: 34547420245     PISSN: 10518223     EISSN: None     Source Type: Journal    
DOI: 10.1109/TASC.2007.898560     Document Type: Conference Paper

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