Fingerprinting the malfunction of devices

International Journal of Thermodynamics

Volumn 10, Issue 2, 2007, Pages 79-85

  El Sayed, Yehia ^a  

^a Advanced Energy Systems   (United States)

Author keywords

Device efficiency degradation; Device malfunction fingerprints; Off design performance of a device

Indexed keywords

COMPUTATIONAL METHODS; DATA REDUCTION; FAILURE ANALYSIS; INFORMATION USE; SYSTEMS ANALYSIS;

DEVICE EFFICIENCY DEGRADATION; DEVICE MALFUNCTION FINGERPRINTS; MALFUNCTIONING DEVICES; OFF-DESIGN PERFORMANCE OF A DEVICE;

PATTERN RECOGNITION;

EID: 34547396572     PISSN: 13019724     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

References (12)

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