Fingerprinting the malfunction of devices

ECOS 2006 - Proceedings of the 19th International Conference on Efficiency, Cost, Optimization, Simulation and Environmental Impact of Energy Systems

Volumn , Issue , 2006, Pages 751-756

  El Sayed, Yehia ^a  

^a Advanced Energy Analysis   (United States)

Author keywords

Device efficiency degradation; Device malfunction fingerprints; Off design performance of a device

Indexed keywords

ENVIRONMENTAL IMPACT;

COMBINED CYCLE; DESIGN INFORMATION; DESIGN POINTS; DEVICE EFFICIENCY; DEVICE MALFUNCTION FINGERPRINTS; EFFICIENCY PARAMETERS; OFF-DESIGN PERFORMANCE;

DESIGN;

EID: 84923079541     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (3)

1. Y. M. El-Sayed (2003), "The Thermoeconomics of Energy Conversions", Elsevier 2003.
2. A.Valero, A. Zaleta, A. Lazzaretto, V. Verda, M. Reini, and V. Rangel (2002), "On the Thermoeconomic Approach to the Diagnosis of Energy System Malfunctions", ECOS 2002 Proceedings, Berlin, Germany, July 3-5 2002, Vol. 1, pages 215-233.
3. F. Cziesla and G. Tsatsaronis (2003), "Exergyeconomic Assessment of the Performance Degradation in a Power Plant at Full and Partial Load", ECOS 2003 Proceedings, Copenhagen, Denmark, June 30 -July 2 2003.