메뉴 건너뛰기




Volumn 59, Issue 1, 2007, Pages 600-604

Microstructural characterization of chromium oxide thin films grown by remote plasma assisted pulsed laser deposition

Author keywords

[No Author keywords available]

Indexed keywords


EID: 34547366802     PISSN: 17426588     EISSN: 17426596     Source Type: Conference Proceeding    
DOI: 10.1088/1742-6596/59/1/128     Document Type: Article
Times cited : (36)

References (12)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.