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Volumn 59, Issue 1, 2007, Pages 600-604
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Microstructural characterization of chromium oxide thin films grown by remote plasma assisted pulsed laser deposition
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Author keywords
[No Author keywords available]
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Indexed keywords
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EID: 34547366802
PISSN: 17426588
EISSN: 17426596
Source Type: Conference Proceeding
DOI: 10.1088/1742-6596/59/1/128 Document Type: Article |
Times cited : (36)
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References (12)
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