Direct measurement of group dispersion of optical components using white-light spectral interferometry

Opto-Electronics Review

Volumn 15, Issue 3, 2007, Pages 144-148

  Chlebus, R ^a   Hlubina, P ^a   Ciprian, D ^a  

^a VSB TECHNICAL UNIVERSITY OF OSTRAVA   (Czech Republic)

Author keywords

Dispersion; Group refractive index; Holey fiber; Low resolution spectrometer; Mach Zehnder interferometer; Quartz crystal; Spectral interferometry; White light source

Indexed keywords

CRYSTALS; HOLEY FIBERS; INTERFEROMETRY; LIGHT SOURCES; MACH-ZEHNDER INTERFEROMETERS; MICHELSON INTERFEROMETERS; OPTICAL SYSTEMS; QUARTZ; REFRACTIVE INDEX; SPECTROMETERS;

GROUP REFRACTIVE INDEX; LOW-RESOLUTION SPECTROMETER; QUARTZ CRYSTAL; SPECTRAL INTERFEROMETRY; WHITE LIGHT SOURCES;

DISPERSION (WAVES);

EID: 34547366007     PISSN: 12303402     EISSN: 18963757     Source Type: Journal    
DOI: 10.2478/s11772-007-0010-z     Document Type: Article

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