Understanding sub-20 nm breakdown behavior of liquid dielectrics

Physical Review Letters

Volumn 99, Issue 1, 2007, Pages

  Virwani, Kumar R ^a   Malshe, Ajay P ^b   Rajurkar, Kamlakar P ^c  

^a UNIVERSITY OF ARKANSAS   (United States)

^b University of Arkansas   (United States)

^c UNIVERSITY OF NEBRASKA LINCOLN   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC BREAKDOWN; ELECTRON EMISSION; LIQUIDS; MOLECULAR STRUCTURE; NANOPROBES;

ATOMIC CLUSTER MIGRATION; LIQUID DIELECTRICS; NANOPROBE BASED MACHINING;

DIELECTRIC PROPERTIES;

EID: 34547361231     PISSN: 00319007     EISSN: 10797114     Source Type: Journal    
DOI: 10.1103/PhysRevLett.99.017601     Document Type: Article

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