Reliability analysis for flexible electronics: Case study of integrated a-Si:H TFT scan driver

Proceedings - Design Automation Conference

Volumn , Issue , 2007, Pages 966-969

  Huang, Tsung Ching ^a   Tseng, Huai Yuan ^b   Kung, Chen Pang ^b   Cheng, Kwang Ting ^a  

^a University of California   (United States)

^b INDUSTRIAL TECHNOLOGY RESEARCH INSTITUTE   (Taiwan)

Author keywords

Amorphous hydrogenated silicon (a Si:H); Flexible electronics; Reliability; Scan driver; Thin film transistor; Threshold voltage

Indexed keywords

AMORPHOUS HYDROGENATED SILICON; CIRCUIT DESIGN; ELECTRICAL INSTABILITY; FLEXIBLE ELECTRONICS; SCAN DRIVER;

COMPUTER SIMULATION; DISPLAY DEVICES; ELECTRONIC EQUIPMENT; FORMABILITY; INTEGRATED CIRCUITS; RELIABILITY ANALYSIS; SILICON;

THIN FILM TRANSISTORS;

EID: 34547353544     PISSN: 0738100X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/DAC.2007.375305     Document Type: Conference Paper

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