Uncertainty evaluation for the spectroradiometric measurement of the averaged light-emitting diode intensity

Applied Optics

Volumn 46, Issue 15, 2007, Pages 2851-2858

  Park, Seongchong ^a   Lee, Dong Hoon ^a   Kim, Yong Wan ^a   Park, Seung Nam ^a  

^a Korea Research Institute of Standards and Science   (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

PHOTOMETRY; RADIOMETERS; RADIOMETRY; UNCERTAIN SYSTEMS;

SPECTRORADIOMETERS; SPECTRORADIOMETRIC MEASUREMENT; THE AVERAGED LED INTENSITY (ALI); UNCERTAINTY EVALUATION;

LIGHT EMITTING DIODES;

EID: 34547331994     PISSN: 1559128X     EISSN: 15394522     Source Type: Journal    
DOI: 10.1364/AO.46.002851     Document Type: Article

References (14)

1. D. G. Pelka and K. Patel, "An overview of LED applications for general illumination," in Design of Efficient Illumination Systems, R. John Koshel, ed., Proc. SPIE 5186, 15-26 (2003).
2. E. F. Schubert, Light-Emitting Diodes (Cambridge U. Press, 2003), pp. 84-98.
3. Commision Internationale de l'Éclairage, Measurement of LEDs, CIE publication 127 (CIE, 1999).
4. Commision Internationale de l'Éclairage, Method of characterizing illuminance meters and luminance meters, CIE Publication 69 (CIE, 1987).
5. J. L. Gardner, Uncertainties in Photometric Integrals [NMI TR 9] (Commonwealth of Australia, 2005), http://www.measurement.gov.au.
6. J. H. Walker, R. D. Saunders, J. K. Jackson, and D. A. McSparron, NBS Measurement Service: Spectral Irradiance Calibration, NBS Special Publication 250-20 (U.S. Government Printing Office, 1987), http://www.physics. nist.gov/Divisions/Div844/manual/sp250series.html.
7. C. E. Gibson and G. T. Fraser, Report of Calibration: Spectral Irradiance Standard, Quartz-Halogen Lamp (Serial # F-522) (NIST, 2001).
8. J. L. Gardner, "Uncertainty propagation for NIST visible spectral standards," J. Res. Natl. Inst. Stand. Technol. 109, 305-318 (2004).
9. J. L. Gardner, "Uncertainties in interpolated spectral data," J. Res. Natl. Inst. Stand. Technol. 108, 69-78 (2003).
10. Y. Ohno, "Photometric standards," in Handbook of Applied Photometry, C. DeCusatis, ed. (Springer-Verlag, 1998), pp. 63-64.
11. P. R. Bevington and D. K. Robinson, Data Reduction and Error Analysis for the Physical Sciences (McGraw-Hill, 2003), pp. 116-141.
12. H. Oana, L. Jahreiss, D. Rich, and S. Trost, "Development and characterization of a miniature dual-channel spectrometer for spectrocolorimetry," in Optically Based Methods for Process Analysis, D. S. Bomse, H. Brittain, S. Farquharson, J. M. Lerner, A. J. Rein, C. Sohl, T. R. Todd, and L. Weyer, eds., Proc. SPIE 1681, 12-28 (1992).
13. D.-J. Shin, D.-H. Lee, C.-W. Park, and S.-N. Park, "A novel linearity tester for optical detectors using high-brightness light emitting diodes," Metrologia 42, 154-158 (2005).
14. Y. Zong, S. W. Brown, B. C. Johnson, K. R. Lykke, and Y. Ohno, "Simple spectral stray light correction method for array spectroradiometers," Appl. Opt. 45, 1111-1119 (2006).