A novel linearity tester for optical detectors using high-brightness light emitting diodes

Metrologia

Volumn 42, Issue 2, 2005, Pages 154-158

  Shin, Dong Joo ^a   Lee, Dong Hoon ^a   Park, Chul Woung ^a   Park, Seung Nam ^a  

^a Korea Research Institute of Standards and Science   (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

ALGORITHMS; DATA ACQUISITION; LIGHT EMITTING DIODES; LIGHT SOURCES; SWITCHING;

DATA-ACQUISITION ALGORITHM; LINEARITY MEASUREMENTS; LINEARITY TESTER; OPTICAL DETECTORS;

DETECTORS;

EID: 24144494571     PISSN: 00261394     EISSN: None     Source Type: Journal    
DOI: 10.1088/0026-1394/42/2/011     Document Type: Article

References (6)

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3. Budde W 1979 Appl. Opt. 18 1555
4. Pitz E 1979 Appl. Opt. 18 1360
5. Zakharchenko A P, Kravtsov V E, Kuznetsov V I, Lovinskii L S, Rogovoi I D and Makkochev A S 1979 Sov. J. Opt. Technol. 46 50 (Engl. Transl.)
6. Nakamura Y 2004 Opt. Photon. News 15 25