Random Telegraph Noise in 130 nm n-MOS and p-MOS Transistors

Device Research Conference - Conference Digest, DRC

Volumn , Issue , 2006, Pages 283-284

  Yoon, Youngchang ^a   Lee, Hochul ^a   Kang, In Man ^a   Park, Byung Gook ^a   Lee, Jong Duk ^a   Shin, Hyungcheol ^a  

^a Seoul National University   (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 34547311616     PISSN: 15483770     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (5)

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2. Scott T. Martin et al., IEEE EDL, Vol. 18, pp. 444-446, 1997.
3. K.K.HUNG et al., IEEE EDL, Vol. 11, pp. 90-92, 1990.
4. Y. Taur, T. H. Ning, "Fundamentals of Modern VLSI Devices".
5. Z. Celik-Butler et al., IEEE TED, Vol 47, pp. 646-648, 2000.