Fabrication of structurally chiral Sc2 O3 films and observation of Bragg resonance at deep UV wavelengths

Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films

Volumn 25, Issue 4, 2007, Pages 1118-1122

  De Silva, Lakshman ^a   Hodgkinson, Ian ^a  

^a UNIVERSITY OF OTAGO   (New Zealand)

Author keywords

[No Author keywords available]

Indexed keywords

BIREFRINGENCE; REFRACTIVE INDEX; SCANNING ELECTRON MICROSCOPY; THIN FILMS;

BRAGG RESONANCES; CHIRAL FILMS; DIELECTRIC PITCH; MATERIAL PROPERTIES;

SCANDIUM COMPOUNDS;

EID: 34547310278     PISSN: 07342101     EISSN: None     Source Type: Journal    
DOI: 10.1116/1.2432347     Document Type: Article

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