-
1
-
-
84954560422
-
Application of reflectance difference spectroscopy to molecular-beam epitaxy growth of GaAs and AlAs
-
Aspnes D E, Harbison J P, Studna A A and Florez L T 1988 Application of reflectance difference spectroscopy to molecular-beam epitaxy growth of GaAs and AlAs J. Vac. Sci. Technol. A 6 1327-32
-
(1988)
J. Vac. Sci. Technol. A
, vol.6
, pp. 1327-1332
-
-
Aspnes, D.E.1
Harbison, J.P.2
Studna, A.A.3
Florez, L.T.4
-
2
-
-
0024750829
-
In situ laser-light scattering. 1. Detection of defects formed during silicon molecular-beam epitaxy
-
Pidduck A J, Robbins D J, Cullis A G, Gasson D B and Glasper J L 1989 In situ laser-light scattering. 1. Detection of defects formed during silicon molecular-beam epitaxy J. Electrochem. Soc. 136 3083-8
-
(1989)
J. Electrochem. Soc
, vol.136
, pp. 3083-3088
-
-
Pidduck, A.J.1
Robbins, D.J.2
Cullis, A.G.3
Gasson, D.B.4
Glasper, J.L.5
-
3
-
-
6744248168
-
Surface-properties probed by 2nd-harmonic and sum-frequency generation
-
Shen Y R 1989 Surface-properties probed by 2nd-harmonic and sum-frequency generation Nature 337 519-25
-
(1989)
Nature
, vol.337
, pp. 519-525
-
-
Shen, Y.R.1
-
4
-
-
3643102422
-
Surface science at atmospheric pressure - reconstructions on (001) GaAs in organometallic chemical vapor deposition
-
Kamiya I, Aspnes D E, Tanaka H, Florez L T, Harbison J P and Bhat R 1992 Surface science at atmospheric pressure - reconstructions on (001) GaAs in organometallic chemical vapor deposition Phys. Rev. Lett. 68 627-30
-
(1992)
Phys. Rev. Lett
, vol.68
, pp. 627-630
-
-
Kamiya, I.1
Aspnes, D.E.2
Tanaka, H.3
Florez, L.T.4
Harbison, J.P.5
Bhat, R.6
-
5
-
-
0031334774
-
Imaging of dynamic processes on surfaces by light
-
Rotermund H H 1997 Imaging of dynamic processes on surfaces by light Surf. Sci. Rep. 29 267-364
-
(1997)
Surf. Sci. Rep
, vol.29
, pp. 267-364
-
-
Rotermund, H.H.1
-
6
-
-
4143055718
-
Sudden onset of pitting corrosion on stainless steel as a critical phenomenon
-
Punckt C, Bölscher M, Rotermund H H, Mikhailov A S, Organ L, Budiansky N, Scully J R and Hudson J L 2004 Sudden onset of pitting corrosion on stainless steel as a critical phenomenon Science 305 1133-6
-
(2004)
Science
, vol.305
, pp. 1133-1136
-
-
Punckt, C.1
Bölscher, M.2
Rotermund, H.H.3
Mikhailov, A.S.4
Organ, L.5
Budiansky, N.6
Scully, J.R.7
Hudson, J.L.8
-
8
-
-
0016025563
-
Application of generalized ellipsometry to anisotropic crystals
-
Azzam R M A and Bashara N M 1974 Application of generalized ellipsometry to anisotropic crystals J. Opt. Soc. Am. 64 128-33
-
(1974)
J. Opt. Soc. Am
, vol.64
, pp. 128-133
-
-
Azzam, R.M.A.1
Bashara, N.M.2
-
9
-
-
0010823629
-
Return-path ellipsometry and a novel normal-incidence null ellipsometer (NINE)
-
Azzam R M A 1977 Return-path ellipsometry and a novel normal-incidence null ellipsometer (NINE) Opt. Acta 24 1039-49
-
(1977)
Opt. Acta
, vol.24
, pp. 1039-1049
-
-
Azzam, R.M.A.1
-
10
-
-
5544222457
-
Optical recognition of atomic steps on surfaces
-
Baumberger F, Herrmann T, Kara A, Stolbov S, Esser N, Rahman T S, Osterwalder J, Richter W and Greber T 2003 Optical recognition of atomic steps on surfaces Phys. Rev. Lett. 90 177402
-
(2003)
Phys. Rev. Lett
, vol.90
, pp. 177402
-
-
Baumberger, F.1
Herrmann, T.2
Kara, A.3
Stolbov, S.4
Esser, N.5
Rahman, T.S.6
Osterwalder, J.7
Richter, W.8
Greber, T.9
-
11
-
-
0001787557
-
Optical in-situ surface control during MOVPE and MBE growth
-
Richter W 1993 Optical in-situ surface control during MOVPE and MBE growth Phil. Trans. R. Soc. A 344 453-66
-
(1993)
Phil. Trans. R. Soc. A
, vol.344
, pp. 453-466
-
-
Richter, W.1
-
12
-
-
0346596676
-
Optical characterization of semiconductor surfaces and interfaces
-
McGilp J F 1995 Optical characterization of semiconductor surfaces and interfaces Prog. Surf. Sci. 49 1-106
-
(1995)
Prog. Surf. Sci
, vol.49
, pp. 1-106
-
-
McGilp, J.F.1
-
13
-
-
0031359695
-
Characterization of epitaxial semiconductor growth by reflectance anisotropy spectroscopy and ellipsometry
-
Zettler J T 1997 Characterization of epitaxial semiconductor growth by reflectance anisotropy spectroscopy and ellipsometry Prog. Cryst. Growth Charact. 35 27-98
-
(1997)
Prog. Cryst. Growth Charact
, vol.35
, pp. 27-98
-
-
Zettler, J.T.1
-
14
-
-
0034324494
-
Reflection anisotropy spectroscopy: A new probe for the solid-liquid interface
-
Sheridan B, Martin D S, Power J R, Barrett S D, Smith C I, Lucas C A, Nichols R J and Weightman P 2000 Reflection anisotropy spectroscopy: a new probe for the solid-liquid interface Phys. Rev. Lett. 85 4618-21
-
(2000)
Phys. Rev. Lett
, vol.85
, pp. 4618-4621
-
-
Sheridan, B.1
Martin, D.S.2
Power, J.R.3
Barrett, S.D.4
Smith, C.I.5
Lucas, C.A.6
Nichols, R.J.7
Weightman, P.8
-
15
-
-
0009333227
-
In-plane optical anisotropy of GaAs/AlAs multiple quantum wells probed by microscopic reflectance difference spectroscopy
-
Koopmans B, Richards B, Santos P, Eberl K and Cardona M 1996 In-plane optical anisotropy of GaAs/AlAs multiple quantum wells probed by microscopic reflectance difference spectroscopy Appl. Phys. Lett. 69 782-4
-
(1996)
Appl. Phys. Lett
, vol.69
, pp. 782-784
-
-
Koopmans, B.1
Richards, B.2
Santos, P.3
Eberl, K.4
Cardona, M.5
-
16
-
-
0000919201
-
Imaging pattern-formation in surfacereactions from ultrahigh-vacuum up to atmospheric pressures
-
Rotermund H H, Haas G, Franz R U, Tromp R M and Ertl G 1995 Imaging pattern-formation in surfacereactions from ultrahigh-vacuum up to atmospheric pressures Science 270 608-10
-
(1995)
Science
, vol.270
, pp. 608-610
-
-
Rotermund, H.H.1
Haas, G.2
Franz, R.U.3
Tromp, R.M.4
Ertl, G.5
-
17
-
-
0034244786
-
Reflection anisotropy microscopy: Improved set-up and applications to CO oxidation on platinum
-
Dicke J, Erichsen P, Wolff J and Rotermund H H 2000 Reflection anisotropy microscopy: improved set-up and applications to CO oxidation on platinum Surf. Sci. 462 90-102
-
(2000)
Surf. Sci
, vol.462
, pp. 90-102
-
-
Dicke, J.1
Erichsen, P.2
Wolff, J.3
Rotermund, H.H.4
-
18
-
-
0033629624
-
Ellipsomicroscopy for surface imaging: Contrast mechanism, enhancement, and application to CO oxidation on Pt
-
Dicke J, Rotermund H H and Lauterbach J 2000 Ellipsomicroscopy for surface imaging: contrast mechanism, enhancement, and application to CO oxidation on Pt(110) J. Opt. Soc. Am. A 17 135-41
-
(2000)
J. Opt. Soc. Am. A
, vol.17
, pp. 135-141
-
-
Dicke, J.1
Rotermund, H.H.2
Lauterbach, J.3
-
20
-
-
0000518724
-
The Pt(110) phase-transitions: A study by Rutherford backscattering, nuclear microanalysis, LEED and thermal-desorption spectroscopy
-
Jackman T E, Davies J A, Jackson D P, Unertl W N and Norton P R 1982 The Pt(110) phase-transitions: a study by Rutherford backscattering, nuclear microanalysis, LEED and thermal-desorption spectroscopy Surf. Sci. 120 389-412
-
(1982)
Surf. Sci
, vol.120
, pp. 389-412
-
-
Jackman, T.E.1
Davies, J.A.2
Jackson, D.P.3
Unertl, W.N.4
Norton, P.R.5
-
21
-
-
4243770410
-
Direct observations of the 1 × 2 surface reconstruction on the Pt(110) plane
-
Kellogg G L 1985 Direct observations of the 1 × 2 surface reconstruction on the Pt(110) plane Phys. Rev. Lett. 55 2168-71
-
(1985)
Phys. Rev. Lett
, vol.55
, pp. 2168-2171
-
-
Kellogg, G.L.1
-
22
-
-
0001413626
-
The CO-induced 1 × 1 ↔ 1 × 2 phase transition of Pt(110) studied by LEED and workfunction measurements
-
Imbihl R, Ladas S and Ertl G 1988 The CO-induced 1 × 1 ↔ 1 × 2 phase transition of Pt(110) studied by LEED and workfunction measurements Surf. Sci. 206 L903
-
(1988)
Surf. Sci
, vol.206
-
-
Imbihl, R.1
Ladas, S.2
Ertl, G.3
-
23
-
-
0000831454
-
Mechanism of the CO-induced 1 × 1 ↔ 1 × 2 structural transformation of Pt
-
Gritsch T, Coulman D, Behm R J and Ertl G 1989 Mechanism of the CO-induced 1 × 1 ↔ 1 × 2 structural transformation of Pt(110) Phys. Rev. Lett. 63 1086-9
-
(1989)
Phys. Rev. Lett
, vol.63
, pp. 1086-1089
-
-
Gritsch, T.1
Coulman, D.2
Behm, R.J.3
Ertl, G.4
-
24
-
-
0035837538
-
CO adsorption on Pt(110) investigated by X-ray photoelectron diffraction
-
Nowicki M, Emundts A, Pirug G and Bonzel H P 2001 CO adsorption on Pt(110) investigated by X-ray photoelectron diffraction Surf. Sci. 478 180-92
-
(2001)
Surf. Sci
, vol.478
, pp. 180-192
-
-
Nowicki, M.1
Emundts, A.2
Pirug, G.3
Bonzel, H.P.4
-
25
-
-
0342824916
-
Imaging surface reactions with a photoemission electron microscope
-
Rotermund H H 1999 Imaging surface reactions with a photoemission electron microscope J. Electron Spectrosc. 9941-54
-
(1999)
J. Electron Spectrosc
, vol.99
, pp. 41-54
-
-
Rotermund, H.H.1
-
26
-
-
0348123944
-
Subsurface oxygen in the CO oxidation reaction on Pt(110): Experiments and modeling of pattern formation
-
von Oertzen A, Mikhailov A S, Rotermund H H and Ertl G 1998 Subsurface oxygen in the CO oxidation reaction on Pt(110): experiments and modeling of pattern formation J. Phys. Chem. B 102 4966-81
-
(1998)
J. Phys. Chem. B
, vol.102
, pp. 4966-4981
-
-
von Oertzen, A.1
Mikhailov, A.S.2
Rotermund, H.H.3
Ertl, G.4
-
27
-
-
33645527661
-
-
Qiao L, Kevrekidis I G, Punckt C and Rotermund H H 2006 Guiding chemical pulses through geometry: Y junctions Phys. Rev. E 73 036219
-
Qiao L, Kevrekidis I G, Punckt C and Rotermund H H 2006 Guiding chemical pulses through geometry: Y junctions Phys. Rev. E 73 036219
-
-
-
-
28
-
-
34547317510
-
-
Heumann J P 2000 Untersuchungen zur CO-Oxidation auf Platin mittels optischer Abbildungsmethoden Dissertation TU-Berlin
-
Heumann J P 2000 Untersuchungen zur CO-Oxidation auf Platin mittels optischer Abbildungsmethoden Dissertation TU-Berlin
-
-
-
|