Reliability and degradation modeling with random or uncertain failure threshold

2007 Proceedings - Annual Reliability and Maintainability Symposium, RAMS

Volumn , Issue , 2007, Pages 392-397

  Peng, Wang ^a   Coit, David W ^b,c  

^a UNITED TECHNOLOGIES RESEARCH CENTER   (United States)

^b RUTGERS UNIVERSITY   (United States)

^c DEPARTMENT OF INDUSTRIAL AND SYSTEMS ENGINEERING   (United States)

Author keywords

Degradation modeling; General path model; Random failure threshold

Indexed keywords

DEGRADATION MODELING; GENERAL PATH MODELS; RANDOM FAILURE THRESHOLDS;

COMPUTER SIMULATION; PROBABILISTIC LOGICS; RANDOM PROCESSES; RELIABILITY THEORY; UNCERTAINTY ANALYSIS;

FAILURE ANALYSIS;

EID: 34547237743     PISSN: 0149144X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/RAMS.2007.328107     Document Type: Conference Paper

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