On the conductivity imaging by MREIT: Available resolution and noisy effect

Journal of Physics: Conference Series

Volumn 73, Issue 1, 2007, Pages

  Liu, J ^a   Seo, K ^b   Sini, M ^b,d   Woo, J ^c  

^a SOUTHEAST UNIVERSITY   (China)

^b Yonsei University   (South Korea)

^c Kyung Hee University   (South Korea)

^d JOHANN RADON INSTITUTE FOR COMPUTATIONAL AND APPLIED MATHEMATICS   (Austria)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 34547200535     PISSN: 17426588     EISSN: 17426596     Source Type: Conference Proceeding    
DOI: 10.1088/1742-6596/73/1/012013     Document Type: Article

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