Scaling behavior in corrosion and growth of a passive film

Physical Review E - Statistical, Nonlinear, and Soft Matter Physics

Volumn 76, Issue 1, 2007, Pages

  Aarao Reis F D A ^a   Stafiej, Janusz ^b  

^a FLUMINENSE FEDERAL UNIVERSITY   (Brazil)

^b INSTITUTE OF PHYSICAL CHEMISTRY   (Poland)

Author keywords

[No Author keywords available]

Indexed keywords

CORROSION; DIFFUSION; FILM GROWTH; FILM THICKNESS; MATHEMATICAL MODELS; TWO DIMENSIONAL;

CROSSOVER TIME; DIFFUSION RATES; METAL-FILM INTERFACE; PASSIVE FILMS;

THIN FILMS;

EID: 34547177909     PISSN: 15393755     EISSN: 15502376     Source Type: Journal    
DOI: 10.1103/PhysRevE.76.011512     Document Type: Article

References (41)

1. D. D. Macdonald, J. Electrochem. Soc. JESOAN 0013-4651 10.1149/1.2069096 139, 3434 (1992).
2. L. Zhang, D. D. Macdonald, E. Sikora, and J. Sikora, J. Electrochem. Soc. JESOAN 0013-4651 10.1149/1.1838364 145, 898 (1998).
3. P. Schmutz and D. Landolt, Electrochim. Acta ELCAAV 0013-4686 10.1016/S0013-4686(99)00293-5 45, 899 (1999).
4. C.-O. A. Olsson and D. Landolt, Electrochim. Acta ELCAAV 0013-4686 10.1016/S0013-4686(02)00841-1 48, 1093 (2003).
5. A.-L. BarabÃsi and H. E. Stanley, Fractal Concepts in Surface Growth (Cambridge University Press, New York, 1995).
6. J. Krug, Adv. Phys. ADPHAH 0001-8732 10.1080/00018739700101498 46, 139 (1997).
7. C. Y. Chao, L. F. Lin, and D. D. Macdonald, J. Electrochem. Soc. JESOAN 0013-4651 10.1149/1.2127591 128, 1187 (1981).
8. N. Cabrera and N. F. Mott, Rep. Prog. Phys. RPPHAG 0034-4885 10.1088/0034-4885/12/1/308 12, 163 (1948).
9. N. Sato and M. Cohen, J. Electrochem. Soc. JESOAN 0013-4651 10.1149/1.2426170 111, 512 (1964).
10. F. P. Fehlner and N. F. Mott, Oxid. Met. OXMEAF 0030-770X 10.1007/BF00603582 2, 59 (1970).
11. L. A. Braunstein and C.-H. Lam, Phys. Rev. E PLEEE8 1063-651X 10.1103/PhysRevE.72.026128 72, 026128 (2005).
12. S. C. Ferreira, Jr., S. G. Alves, A. Faissal Brito, and J. G. Moreira, Phys. Rev. E PLEEE8 1063-651X 10.1103/PhysRevE.71.051402 71, 051402 (2005).
13. D. Rodríguez-Pérez, J. L. Castillo, and J. C. Antoranz, Phys. Rev. E PLEEE8 1063-651X 10.1103/PhysRevE.72.021403 72, 021403 (2005).
14. F. D. A. AarÃo Reis, Phys. Rev. E PLEEE8 1063-651X 10.1103/PhysRevE.73.021605 73, 021605 (2006).
15. A. Kolakowska, M. A. Novotny, and P. S. Verma, Phys. Rev. E PLEEE8 1063-651X 10.1103/PhysRevE.73.011603 73, 011603 (2006).
16. C. M. Horowitz and E. V. Albano, Phys. Rev. E PLEEE8 1063-651X 10.1103/PhysRevE.73.031111 73, 031111 (2006).
17. J. Saunier, A. ChaussÃ, J. Stafiej, and J. P. Badiali, J. Electroanal. Chem. JECHES 0022-0728 563, 239 (2004).
18. F. D. A. AarÃo Reis and J. Stafiej, J. Phys.: Condens. Matter JCOMEL 0953-8984 10.1088/0953-8984/19/6/065125 19, 065125 (2007).
19. D. E. Davies, U. R. Evans, and J. N. Agar, Proc. R. Soc. London, Ser. A PRLAAZ 1364-5021 225, 443 (1954).
20. E. J. Caule, K. H. Buob, and M. Cohen, J. Electrochem. Soc. JESOAN 0013-4651 108, 829 (1961).
21. H. Sakai, T. Tsuji, and K. Naito, J. Nucl. Sci. Technol. JNSTAX 0022-3131 26, 321 (1989).
22. R. H. Jutte, B. J. Kooi, M. A. J. Somers, and E. J. Mittemeijer, Oxid. Met. OXMEAF 0030-770X 48, 87 (1997).
23. P. C. J. Graat, M. A. J. Somers, and E. J. Mittemeijer, Thin Solid Films THSFAP 0040-6090 353, 72 (1999).
24. M.-G. VergÃ, C.-O. A. Olsson, and D. Landolt, Corros. Sci. CRRSAA 0010-938X 10.1016/j.corsci.2004.02.005 46, 2583 (2004).
25. N. Bertrand, C. Desgranges, A. Terlain, D. Poquillon, and D. Monceau, in Proceedings of The First International Conference on Diffusion in Solids and Liquids, edited by, Andreas Aochsner, Jose Gracio, and, Frederic Barlat, (Editura Mediamira, Romania, 2005).
26. C. Desgranges, N. Bertrand, K. Abbas, D. Monceau, and D. Poquillon, Mater. Sci. Forum MSFOEP 0255-5476 461-464, 481 (2004).
27. M. F. Castez, B. Blum, R. C. Salvarezza, and H. G. Solari, Phys. Rev. E PLEEE8 1063-651X 10.1103/PhysRevE.67.061605 67, 061605 (2003).
28. A. P. Reverberi and E. Scalas, Physica A PHYADX 0378-4371 254, 348 (1998).
29. M. Eden, in Proceedings of the Fourth Berkeley Symposium on Mathematical Statistics and Probability, edited by, F. Neyman, (University of California, Berkeley, 1961), Vol. 4, p. 223.
30. D. E. Wolf and J. KertÃsz, J. Phys. A JPHAC5 0305-4470 10.1088/0305-4470/20/4/014 20, L257 (1987).
31. M. Kardar, G. Parisi, and Y.-C. Zhang, Phys. Rev. Lett. PRLTAO 0031-9007 10.1103/PhysRevLett.56.889 56, 889 (1986).
32. E. Marinari, A. Pagnani, and G. Parisi, J. Phys. A JPHAC5 0305-4470 10.1088/0305-4470/33/46/303 33, 8181 (2000);
33. F. D. A. AarÃo Reis, Phys. Rev. E PLEEE8 1063-651X 10.1103/PhysRevE.69.021610 69, 021610 (2004).
34. P. Meakin and J. M. Deutch, J. Chem. Phys. JCPSA6 0021-9606 10.1063/1.451129 85, 2320 (1986).
35. J. Krug and P. Meakin, Phys. Rev. Lett. PRLTAO 0031-9007 10.1103/PhysRevLett.66.703 66, 703 (1991).
36. M. Z. Bazant, Phys. Rev. E PLEEE8 1063-651X 10.1103/PhysRevE.73.060601 73, 060601 (R) (2006).
37. Y. Kim and S. Y. Yoon, Phys. Rev. E PLEEE8 1063-651X 10.1103/PhysRevE.66. 031105 66, 031105 (2002).
38. A. P. Reverberi, A. G. Bruzzone, L. Maga, and A. Barbucci, Physica A PHYADX 0378-4371 354, 323 (2005).
39. S. F. Edwards and D. R. Wilkinson, Proc. R. Soc. London, Ser. A PRLAAZ 1364-5021 10.1103/PhysRevLett.56.889 381, 17 (1982).
40. F. D. A. AarÃo Reis, Phys. Rev. E PLEEE8 1063-651X 10.1103/PhysRevE.63.056116 63, 056116 (2001).
41. W. E. Hagston and H. Ketterl, Phys. Rev. E PLEEE8 1063-651X 10.1103/PhysRevE.59.2699 59, 2699 (1999).