Comparison between BSIM4.X and HSPICE flicker noise models in NMOS and PMOS transistors in all operating regions

Microelectronics Reliability

Volumn 47, Issue 8, 2007, Pages 1222-1227

  Noulis, T ^a   Siskos, S ^a   Sarrabayrouse, G ^b  

^a ARISTOTLE UNIVERSITY OF THESSALONIKI   (Greece)

^b LAAS CNRS   (France)

Author keywords

[No Author keywords available]

Indexed keywords

BANDWIDTH; COMPUTER SIMULATION; MATHEMATICAL MODELS; TRANSISTORS;

FLICKER NOISE; NOISE MEASUREMENTS;

SPURIOUS SIGNAL NOISE;

EID: 34547172831     PISSN: 00262714     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.microrel.2006.09.021     Document Type: Article

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