Measuring energies at the nanometer-scale of molecular organic materials with an atomic force microscope: TTF-TCNQ as a case study

Journal of Low Temperature Physics

Volumn 142, Issue 3-4, 2006, Pages 121-126

  Fraxedas, J ^a   Langer, J ^b   Diez I ^c   Sanz, F ^c  

^a INSTITUT DE CIÈNCIA DE MATERIALS DE BARCELONA ICMAB CSIC   (Spain)

^b FREIE UNIVERSITÄT BERLIN   (Germany)

^c UNIVERSITY OF BARCELONA   (Spain)

Author keywords

Atomic force microscopy; Molecular organic materials; TTF TCNQ

Indexed keywords

ATOMIC FORCE MICROSCOPY; ELASTIC DEFORMATION; ELECTRON ENERGY LEVELS; NANOINDENTATION; PLASTIC DEFORMATION;

ELASTIC ENERGY; MOLECULAR ORGANIC MATERIAL;

ORGANIC COMPOUNDS;

EID: 34547138462     PISSN: 00222291     EISSN: 15737357     Source Type: Journal    
DOI: 10.1007/BF02679479     Document Type: Conference Paper

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