Spatial conductivity mapping of carbon nanotube composite thin films by electrical impedance tomography for sensing applications

Nanotechnology

Volumn 18, Issue 31, 2007, Pages

  Hou, Tsung Chin ^a   Loh, Kenneth J ^a   Lynch, Jerome P ^a,b  

^a UNIVERSITY OF MICHIGAN   (United States)

^b University of Michigan   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CARBON NANOTUBES; ELECTRIC CONDUCTIVITY; ELECTRIC IMPEDANCE TOMOGRAPHY; LAYERED MANUFACTURING; MATHEMATICAL MODELS;

CONDUCTIVITY MAPPING; ELECTRIC CURRENT EXCITATION; ELECTRICAL IMAGING; STRUCTURAL DEFECTS;

THIN FILMS;

CARBON NANOTUBE; NANOCOMPOSITE;

ARTICLE; COMPOSITE MATERIAL; COMPUTER ASSISTED IMPEDANCE TOMOGRAPHY; CONDUCTANCE; ELECTRIC CURRENT; ELECTRODE; FILM; MATHEMATICAL MODEL; PH; PRIORITY JOURNAL; STIMULATION;

EID: 34547118116     PISSN: 09574484     EISSN: 13616528     Source Type: Journal    
DOI: 10.1088/0957-4484/18/31/315501     Document Type: Article

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