The dependence of the size distribution of the pulsed laser deposited micron sized particles from the laser fluence and its influence to the thickness of the deposited layer

Applied Surface Science

Volumn 253, Issue 19, 2007, Pages 8160-8164

  Kresz, N ^a   Smausz, T ^a   Hopp, B ^a  

^a UNIVERSITY OF SZEGED   (Hungary)

Author keywords

Ablation; Atomic force microscope; Polytetrafluoroethylene; Pulsed laser deposition; Thin film growth

Indexed keywords

ATOMIC FORCE MICROSCOPY; COMPUTER SIMULATION; FILM GROWTH; LASER PULSES; OPTICAL MICROSCOPY; SILICON WAFERS; SIZE DISTRIBUTION; THIN FILMS;

LASER FLUENCE; THIN FILM GROWTH; TRANSFERRED MATERIALS;

MICROSTRUCTURE;

EID: 34447526456     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.apsusc.2007.02.126     Document Type: Article

References (11)

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